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Used HP 4145B

Manufacturer:HP

Refurbished by:Allwin21 Corp

Designed for production-line and laboratory use, the HP4145B is the electronics industry's first standalone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage-and current-sensitive devices, measures the resulting current and voltage responses, and displays the results in a user-selectable format (graph, list, matrix, or schmoo) on a built-in CRT display. An on-board programmable calculator provides real-time calculation of voltage/current-dependent parameters, such as the current gain (HFE) and transconductance(gm) of transistors, which can also be displayed on the CRT. A number of powerful graphic analysis tools--marker, cursor, line function, and interpolation--enhance the HP 4145B's basic capabilities and provide fast, accurate analysis of semiconductor devices, leading to increased production yields and improved device quality.

Four built-in source monitor units (SMUs) are the heart of the HP 4145B. Each SMU can be independently programmed to function as either a voltage source/current monitor or a current source/voltage monitor. Thus a bipolar transistor, for example, can be completely characterized in common-base, common-emitter, and common-collector configurations without changing connectionsoonly changing the SMU’s operating modes is required. The HP 4145B is also equipped with 2 voltage sources and 2 voltage monitors for measurements on devices having more than 4 terminals, such as ICs. The HP4145B can be controlled from the front panel via the HP-IB (standard), or by measurement setups stored on diskettes.

Displayed information--measurement setups, auto-sequence programs, and measurement results can be dumped directly onto an external graphics plotter to obtain publication quality hard copies. A built-in 3”inch disk drive enables you to store measurement setups and measured data, which can be accessed by another compatible HP disk drive for further processing.

HP4145B Parameter Analyzer key features:

  • Fully automatic, high-peed dc characterization of semiconductor devices
  • High-resolution, wide-range sourcing and measurement
  • I: 50 fA to 100 mA; V: 1 mV to 100 V
  • Maximum 1140 measurement and display points for precise measurement and analysis
  • Flexible graphic analysis functions for quick parameter extraction
  • Built-in 3-inch disk drive for storage of 240 user programs or 105 measurement results

We can also provide the following e- test used equipment.

·Temptronic TP03500
·Rucker and Kolls Model 260J Probing Station
·Refurbished ELECTROGLAS HORIZON 4085X
·SIGNATONE S-250 Probe
·Refurbished EG 1034
·Refurbished EG 2001
·Refurbished MP 2020
·Refurbished HP 4145B
·Refurbished HP 4062
·Refurbished HP 4155

·AW PCM/IC Software

Rapid Thermal Process

AccuThermo AW 410

AccuThermo AW 610

AccuThermo AW 810

AG Heatpulse 210

AG Heatpulse 410

AG Heatpulse 610

Used Plasma Asher

Matrix 105

Matrix 10

Gasonics Aura 1000

Gasonics Aura 3010

Gasonics Aura 2000LL

Branson IPC 3000

Branson IPC L3200

Used Plasma Etcher

Matrix 303

Gasonics AE 2001

AutoEtch Lam 490

Lam Rainbow 4520 Oxide Etch

Lam 4428 for Plasma Etch

Used Electrical Test

PCM Software

HP 4062UX

HP 4145B

EG 1034

EG 2001

EG HORIZON 4085X

Temptronic TP03500

Used Metrology Instruments

Hitachi S8840

Hitachi FE-SEM model S-4160

Hitachi S-4500

Hitachi S-4700

Hitachi S-8820

Hitachi S-9300

Micrion FIB model M9500

LEO FE-SEM model 982

Other Semiconductor Equipment

 

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PlasmaEquipments is DBA of Allwin21 Corp.